HREM Characterization of Interfaces in Thin MOCVD Superconducting Films
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چکیده
This paper is concerned with high-T, superconducting compounds produced by metal-organic chemical vapour deposition. The nanostructure of different types of interfaces yttria stabilized zirconia buffer / (l-102)-sapphire substrate, YBazCu307-, film / Y2O3 precipitates as well as YBa2Cu307-, film / (001)-NdGa03, -SrTiO3, and -MgO substrates has been investigated by high resolution electron microscopy. The orientation relationships and the corresponding layer sequences across the interfaces have been determined with the aid of computer simulations.
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تاریخ انتشار 2017